Porokhov N.V., Chukharkin M.L., Maresov A.G., Snigirev O.V., Levin E.E., Kalaboukhov A.S., Zenova E.V.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate single crystal, buffer layers, magnetron sputtering, X-ray diffraction, phase composition, microstructure, current-voltage characteristics, temperature dependence, resistive transition, magnetic field dependence, activation energies, critical caracteristics, critical current, flux flow, upper critical fields, experimental results
Kudriashov A.V., Klyachkin L.E., Malyarenko A.M., Nashchekin A.V., Romanov V.V., Rykov S.A., Bagraev N.T.
Ключевые слова: HTS, Bi2223, films, defects columnar, irradiation effects, ion irradiation, pinning, fabrication, magnetron sputtering, annealing process, resistive transition, resistivity, temperature dependence, critical caracteristics, Jc/B curves, doping effect, critical current density, angular dependence, pinning force, experimental results
Eisterer M., Sokolovsky V., Prikhna T.A., Moshchil V.E., Seidel P., Shapovalov A.P., Shaternik V.E., Kovylaev V.V., Shaternik A.V., Romaka V.V., Ponomaryov S.S.
Blagoev B., Kovacheva D., Nurgaliev T., Mateev E., Nedkov I., Buchkov K., Gajda G., Slavov L., Starbova I., Nankovski M., Starbov N.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, magnetron sputtering, magnetic coating, multilayered structures, substrate single crystal, fabrication
Ключевые слова: HTS, YBCO, amorphous state, substrates, buffer layers, coated conductors, magnetron sputtering, microstructure, X-ray diffraction, fabrication
Suzuki Y., Kumagai S., Zhou S., Sato R., Watanabe H., Hsu C., Sasaki M., Adachi K., Sugimoto N., Iguchi N., Hioki T., Ichiki A., Motohiro T., Noh J., Sakurahara Y., Okabe K., Takai O., Honma H., Sakoda H., Sasagawa H., Doy H., Hori H., Nishikawa S., Nozaki T.
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